Thin Film & Nanoparticle Characterization

Thin film and nanoparticle characterization can provide information of thickness and size.  For example dynamic light scattering will provide average particle size of particles in a suspension and ellipsometry can provide film thickness and dielectric constant.

Instrumentation:

Spectrometery

• Custom Built 1.5 T, 20 GHz Rotational Field Microwave Photovoltage Spectrometer
• Cameca IMS 7f Secondary Ion Mass Spectrometer
• Kratos Axis Ultra X-ray Photoelectron Spectrometer
• ThermoNicolet Nexus 870 IR Spectrometer with PM-IRRAS
• Varian Cary 5000 UV-Vis-NIR Spectrometer

Thickness Determination

• Nanometrics Nanospec 210 Dielectric Thickness Measurement
• KLA Tencor Alpha Step 500 Profiler
• Sentech SE-400 Ellipsometer
• Kratos Axis Ultra X-ray Photoelectron Spectrometer with Ion Gun

Refractive Index Determination

• Metricon 2010 Prism Coupler
• Sentech SE-400 Ellipsometer

Particle Sizing

• Photocorp DynaLS Static/Dynamic Light Scattering
• Microtrac Inc. Nanotrac Dynamic Light Scattering

Others

• Janis & Agilent 0.25 K, 9 T, 20 GHz Microwave He-3 System
• Lakeshore 4.2 K, 1 T, 20 GHz Microwave Cryogenic Probe Station
• Custom Built 0-20 GHz Microwave Dielectric Imaging System
• Fluid Inc. USGS Model Fluid Inclusion Stage
• Rigaku S-MAX 3000 Small and Wide Angle X-ray Scattering
• Nikon D-Eclipse Polarizing Confocal Fluorescence Microscope