Microscopy is used to provide spatial information about materials.

Instrumentation:

Profilometry

• KLA Tencor Alpha Step 500 Profilometer
• Microphotonics Photomap 3D Interferometer
• Veeco Nanoscope Dimensions 3100 SPM
• Veeco Nanoscope Enviroscope SPM
• Veeco Nanoscope Multimode SPM
• Veeco Nanoscope IV Controller SPM
• Veeco Nanoscope III Controller SPM

Optical

• Nikon/Cargill Eclipse E600 Polarising Microscope with RI Oils
• Zeiss Axiovert 25 Optical Metallograph with Clemex Vision 3
• Olympus BX-52P Polarized Optical Microscope
• Nikon D-Eclipse Polarized Fluorescence Confocal Microscope
• Optical Coherence Tomography System
• Tsunami/Spectra-Physics Laser-Scanning Non-Linear Optical Imaging Microscope

Electron

• JEOL JSM-5900LV SEM
• Philips XL 30 Environmental SEM
• Cambridge Stereoscan 120 SEM
• JEOL JAMP-9500F Scanning Auger Microprobe
• JEOL JEM-2100F TEM
• JEOL 2000 FX TEM

Infrared

• Bruker Tensor 27/Hyperion 2000 IR Microscope
• Varian 670/620 64x64 Focal Plane Array IR Microscope
• Renishaw inVia Raman Microscope
• Jobin Yvon LabRamHR Raman Microscope

Others

• Kratos Axis Ultra X-ray Photoelectron Spectroscopy
• Cameca SX-100 Electron Microprobe
• Cameca IMS 7f Secondary Ion Mass Spectrometer
• Toho Technology FLX-2320 Thin Film Stress Measurement
• Lakeshore 4.2 K, 1 T, 20 GHz Microwave Cryogenic Probe Station
• Fluid Inc. USGS Model Fluid Inclusion Stage