Transmission electron microscope


Facility: Materials Electron Microscope Facility

Location: Mechanical & Manufacturing Engineering EITC E3-155

Access: Fee for service & trained students/researchers & collaborative projects

Contact: Abdul Khan 204-474-6909 or 204-474-6977

JEOL 2100F is a multipurpose, high resolution transmission electron microscope for research in different areas of materials science, biology, medicine and semiconductor industry. It has a high brightness and high beam stability due to field emission electron source. The point to point resolution is 0.2nm. Standard techniques that are available include bright field/dark field imaging, high resolution lattice imaging and electron diffraction. In addition it is equipped with Fischione high angle annular dark field detector (HAADF) for Z-contrast imaging and Oxford energy dispersive spectrometer (EDS) for chemical analysis at nano scale. Gatan tridiem imaging filter (GIF) and electron energy loss spectrometer is also installed for Energy Filtered imaging and EELS analysis. In-situ TEM investigations are also possible due to a digital 2kx2k ultrascan camera.

Specimen holders
Variety of sample holders is available for different analyses

  • Single tilt holder, JEOL EM-21020
  • Low background double tilt Be tip holder, JEOL EM 31640
  • Fischione advanced tomography holder, 2020
  • Gatan Cryo transfer system for beam sensitive biological samples

Specimen preparation equipment

  • Gatan Precision Ion Polishing System (PIPS) for TEM sample preparation from metallic and semi conductors.
  • Struers Tenupol-3 for TEM sample preparation from metallic samples
  • X-sectional specimen preparation kit for semiconductor materials
  • Gatan-656 dimple grinder
  • Several grinding and polishing wheels


Gatan Precision Ion Polishing System (PIPS for TEM sample preparation


HRTEM image of Au nano-starts

DF image

Dark field image of γ' precipitates in nickel base super alloy


[111] CBED pattern of γ' precipitate in nickel base super alloy