Imaging  provides surface spatial information.  This could be morphological as in the case of scanning probe microscopy or chemical as in the case of Raman microscopy.

Instrumentation:

Optical Microscopy

• Olympus BX-52P Polarized Microscope
• Nikon D-Eclipse Fluorescence Confocal Polarized Microscope
• Zeiss Axiovert 25 Optical Metallograph with Clemex Vision 3
• Tsunami/Spectra-Physics Laser Scanning Non-linear Optical Imaging Microscope
• Optical Coherence Tomography Imaging System

Scanning Electron Microscopy

• JEOL JSM-5900LV SEM
• Philips XL 30 Environmental SEM
• Cambridge Stereoscan 120 SEM
• JAMP-9500F Scanning Auger Microprobe

Transmission Electron Microscopy

• JEOL JEM-2100F TEM
• JEOL 2000FX TEM

Scanning Probe Microscopy

• Veeco Nanoscope Dimensions 3100
• Veeco Nanoscope Enviroscope
• Veeco Nanoscope Multimode Microscope
• Veeco Nanoscope III Controller
• Veeco Nanoscope IV Controller

Infrared Spectroscopy

• Bruker Tensor 27/Hyperion 2000 Microscope
• Varian 670/620, 64x64 Focal Plane Array Microscope

Raman Spectroscopy

• Renishaw inVia Microscope
• Jobin Yvon LabRamHR Raman Microscope

Miscellaneous

• Cameca SX-100 Electron Microprobe
• Kratos Axis Ultra X-ray Photoelectron Spectrometer
• Technosyn Cold Cathode Luminescence 8200 MK II
• Fluid Inc. USGS Fluid Inclusion Stage
• Cameca IMS 7f Secondary Ion Mass Spectrometer
• Microphotonics Photomap 3D Interferometer
• Custom Built 0-20 GHz Microwave Dielectric Imaging System